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Philippe Pougnet

Philippe PougnetExpert in reliability and product-process technology at Valeo, Philippe Pougnet is a doctor-engineer of the Scientific and Medical University of Grenoble and an INPG engineer. He is responsible for the management of the reliability of mechatronic sysems manufactured in mass production. Read More Read Less

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1.
Nanometer-scale Defect Detection Using Polarized Light9 % POD/NR
Nanometer-scale Defect Detection Using Polarized Light
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley-Iste
No Review Yet
₹15,980
₹14,542
Binding:
Hardback
Release:
22 Aug 2016
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Embedded Mechatronic Systems, Volume 133 %
Embedded Mechatronic Systems, Volume 1
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Philippe (VeDeCom, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
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₹11,726
₹7,856
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
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3.
Embedded Mechatronic Systems, Volume 233 %
Embedded Mechatronic Systems, Volume 2
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Professor, INSA Rouen, France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
No Review Yet
₹11,726
₹7,856
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
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4.
Applications et metrologie a l'echelle nanometrique 1: materiaux intelligents, onde electromagnetique et incertitudesNR
Applications et metrologie a l'echelle nanometrique 1: materiaux intelligents, onde electromagnetique et incertitudes
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
₹9,264
Binding:
Paperback
Release:
12/1/2021
Language:
French
International Edition
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5.
Applications et metrologie a l'echelle nanometrique 2: systemes de mesure, ingenierie quantique et methodes d'optimisation fiabilisteNR
Applications et metrologie a l'echelle nanometrique 2: systemes de mesure, ingenierie quantique et methodes d'optimisation fiabiliste
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
₹9,264
Binding:
Paperback
Release:
12/1/2021
Language:
French
International Edition
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6.
Applications and Metrology at Nanometer Scale 114 % POD/NR
Applications and Metrology at Nanometer Scale 1
By: Pierre Richard Dahoo, Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley
No Review Yet
₹15,865
₹13,644
Binding:
Hardback
Release:
16 Mar 2021
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
7.
Applications and Metrology at Nanometer-Scale 214 % POD/NR
Applications and Metrology at Nanometer-Scale 2
By: Pierre Richard Dahoo, Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley
No Review Yet
₹15,865
₹13,644
Binding:
Hardback
Release:
04 May 2021
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
8.
Embedded Mechatronic Systems 214 % NR
Embedded Mechatronic Systems 2
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Abdelkhalak (Professor, INSA Rouen, France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
No Review Yet
₹11,440
₹9,838
Binding:
Hardback
Release:
03 Mar 2020
Language:
English
International Edition
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9.
Les systemes mecatroniques embarques 1: Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmenteeNR
Les systemes mecatroniques embarques 1: Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmentee
By: Hami, Abdelkhalak El, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
₹8,888
Binding:
Paperback
Release:
1/31/2020
Language:
French
International Edition
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10.
Les systemes mecatroniques embarques 2: Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmenteeNR
Les systemes mecatroniques embarques 2: Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmentee
By: Hami, Abdelkhalak El, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
₹8,892
Binding:
Paperback
Release:
1/31/2020
Language:
French
International Edition
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11.
Embedded Mechatronic Systems14 % NR
Embedded Mechatronic Systems
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet, Philippe (VeDeCom, Valeo, Paris, France) Pougnet
Publisher: Elsevier Science
No Review Yet
₹11,440
₹9,838
Binding:
Hardback
Release:
15 Nov 2019
Language:
English
International Edition
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12.
Defauts a l'echelle nanometrique en lumiere polariseeNR
Defauts a l'echelle nanometrique en lumiere polarisee
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
₹5,208
Binding:
Paperback
Release:
7/31/2016
Language:
French
International Edition
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